Information Management Instructors
 

                                                 

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INFORMATION MANAGEMENT

Dr. Bhavani Thuraisingham

Course Lecturer: 601, 603

Dr. Bhavani Thuraisingham is a Professor of Computer Science at the University of Texas at Dallas where she is also the  Director of the Cyber Security Research Center in the Erik Jonsson School of Engineering and Computer Science. Prior to joining the university in October 2004, she worked for 24 years in the commercial industry, the MITRE Corporation and the National Science Foundation. Her work in information security and information management has resulted in over 100 journal articles, over 200 refereed conference papers, and three US patents. She is the author of ten books in data management, data mining and data security. She is also a Fellow of IEEE, AAAS and the British Computer Society, and received the IEEE Computer Society’s 1997 technical Achievement Award.  Dr. Thuraisingham was educated in the United Kingdom both at the University of Bristol and the University of Wales. She is currently completing a certificate course in Terrorism Studies at St. Andrews University in Scotland.

Jenifer Wierum

Course Lecturer:  386 387

 

Ms. Wierum is a U.S. Army Electronics Intelligence (ELINT) Analyst Veteran, and a Senior Information Assurance Analyst who has been working as a Department of Defense (DoD) Contractor for the past 19 years.  She is an expert in C&A processes, with a B.S. in Computer Science, who has managed several developmental efforts for the DoD.  Ms. Wierum has worked on requirements, design and development, testing, and C&A issues for both classified and unclassified systems.  She was the Lead Test Engineer and C&A Lead for the Air Force implementation of the Public Key Infrastructure (PKI) for more than five years.  She has lead and participated in several DoD and Service-related technical and C&A working groups.  She is exceedingly familiar with multiple C&A processes to include DITSCAP/DIACAP, NIST C&A, NIACAP, DCID 6/3, and the ISO 27000 Series.  

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